The MPS2100 is the newest high-resolution analyzer from Chapman Instruments. Specifically designed for surface measurement and analysis, it can be used both as a production tool for in-line quality inspection and as a research and development tool for establishing standards and studying tolerances. Using the same non-contact measurement technology as other Chapman analyzers, the MPS2100 allows users to quickly perform high-resolution linear or circular scans. The powerful, user-friendly Windows®-based operating software can be programmed to execute a range of routines and report on-line production data for further analysis. Password security and event viewer/error logging come standard with Chapman software. Optional robotic arm for handling 150mm, 200 mm and 300 mm wafers. ​