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光学检测系统
全自动光学检测系统
晶圆处理系统
晶圆测量系统
PWB500V Automatic Optical Inspection System after Wire Bonding
WIS1000 The first optical detection system
WIS1100 - the first optical inspection system
WIS8000 The first optical detection system
DIS8000 The second optical detection system
ISP3100 The third optical detection system
塑封后自动检测系统 - PMI3000
PPI3300 - Post-Probe Inspection System
PDA1000V Optical inspection system after placement
PDA100K Optical inspection system after placement
PWB2000V Automatic Optical Inspection System after Wire Bonding
PWB1000V Automatic Optical Inspection System after Wire Bonding
WPS3800 Wafer Packaging and Unpacking System
WPS3200 Wafer Packaging and Unpacking System
晶圆分选系统 - WSS3200
晶圆搬运系统 - WSS8000
WSS2150W Wafer Weight Measurement and Handling System
WSS2200B Wafer Handling System
WTS300G Wafer batch handling system
WTS100G Wafer batch handling system
WID8000 Automatic barcode printing and labeling system
WID150R Wafer Lot ID Reader System
WID100R Wafer Lot ID Reader System